An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules

Journal article

Peer reviewed

An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules

A. Tishelman-Charny, A. Affolder, F. Capocasa, E. Duden, V. Fadeyev, M. Gignac, C. Helling, H. Herde, J. Johnson, D. Lynn, …

Journal of instrumentation, Vol.19(10), p.P10002

10/01/2024

DOI: https://doi.org/10.1088/1748-0221/19/10/P10002

Abstract

Particle tracking detectors

Si microstrip and pad detectors

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Title: An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules
Creators: A. Tishelman-Charny - Brookhaven National Laboratory
A. Affolder - University of California, Santa Cruz
F. Capocasa - Department of Physics, Brandeis University, Waltham, MA, United States
E. Duden - Brandeis University
V. Fadeyev - University of California, Santa Cruz
M. Gignac - University of California, Santa Cruz
C. Helling - University of British Columbia
H. Herde - Lund University
J. Johnson - University of California, Santa Cruz
D. Lynn - Brookhaven National Laboratory
G. Sciolla - Brandeis University
Publication Details: Journal of instrumentation, Vol.19(10), p.P10002
Identifiers: 9924592317901921
Academic Unit: Martin A. Fisher School of Physics
Language: English
Resource Type: Journal article