Logo image
Home Academic units
Sign in
Patent Quality: Towards a Systematic Framework for Analysis and Measurement
Journal article   Peer reviewed

Patent Quality: Towards a Systematic Framework for Analysis and Measurement

Kyle Higham, Gaétan de Rassenfosse and Adam B Jaffe
Research policy, Vol.50(4), p.104215
05/2021

Abstract

patent policy patents patent quality technological impact patent value patent citations

UN Sustainable Development Goals (SDGs)

This output has contributed to the advancement of the following goals:

#9 Industry, Innovation and Infrastructure
url
https://doi.org/10.1016/j.respol.2021.104215View
Published (Version of record) Open

Details